Silicon Designs – Single axis MEMS VC accelerometers for measurement versatility on three orthogonal axes

Silicon Designs has announced the added versatility of its Model 2210 Series, to include measurement capabilities on one, two, or three orthogonal axes. Low-noise single axis Model 2210 accelerometer modules integrate a MEMS VC accelerometer chip with high-drive, low-impedance buffering for reliable, repeatable measurements. When used with a Silicon Designs mounting block, such as the Model 2330-BLK, the model can effectively measure on either one, two, or three axes, allowing for the specification of a single part number for multiple requirements, thereby reducing in-house inventory counts. Offered in ranges from ±2g to ±400g, the series generates two analog voltage outputs which vary in response to applied acceleration. Customers can utilize either single-ended or differential output, the latter of which doubles accelerometer sensitivity over single-ended versions. The sensitive axis of the device is perpendicular to the package bottom, with positive acceleration defined as a force pushing on the bottom of that package. Output scale factor is independent from the supply voltage of +8V to +32V. At zero acceleration, differential output voltage is nominally 0VDC; at full scale, ±4VDC. Sensing elements of the device are packaged within a compact, lightweight, anodized epoxy sealed aluminum housing, occupying a total footprint of just one square inch. Their design features a simple-yet-robust four-wire connection and internal voltage regulator, which minimizes supply voltage variation effects. Units are relatively insensitive to temperature changes and feature quick, easy self-calibration. The modules are ideal for lower frequency vibration testing requirements, including vibration analysis, machinery control, modal analysis, robotics and crash testing. With their versatile design and performance reliability, they may be specified within a variety of aerospace, automotive, defense, energy, industrial, and test and measurement applications.