Modular high-precision SMU to expedite the development of semiconductor devices

Yokogawa Test & Measurement Corporation has released its AQ2300 series high-performance, high-speed SMU (Source Measure Unit) into the European marketplace. Managing various density needs for semiconductor/communication devices, the series modular SMU delivers high-quality pulse generation alongside high-precision voltage/current generation and measurements. Thanks to its inherent productivity and expandability characteristics, the two-channel SMU module also saves time and space when performing the typically complex measurement functions necessary for semiconductor devices.

The proliferation of smartphones and tablets, the rise of AI, and the expansion of autonomous vehicles increase the necessity for communication infrastructure to improve speeds and address future power demands. For laser devices, in particular, engineers must undertake accurate sourcing of the mainly current signals that optimise laser control, adjusting the inputs accordingly to measure the precise output of laser light. Yokogawa, therefore, set about developing its new series SMU with high levels of precision, functionality and modularity to keep pace with the miniaturisation of next-generation devices and the increasing complexity of measurements required for R&D evaluation.

The highly modular series SMU enables users to select the number of channels required (up to 18) to satisfy system must within a limited space, supporting efficient facility operation.

High-quality pulse waveform generation (50μs-width) is also an important feature. This function suppresses the heat generated by the device during testing, making more accurate measurements possible. The rise and fall times may be disturbed due to the device or wiring, but by adjusting the parameter settings, a smooth output waveform can be achieved.

Interoperability is a further feature of note. The series SMUs have trigger ports not only on the frame side, but also on each SMU channel. Moreover, in-frame synchronisation functionality allows flexible selection of the connection method. In total, three trigger synchronisation functions are available: Synchronisation of frames with external equipment; synchronisation of SMU channel with external equipment; and synchronisation between SMU channels.

The frame can also feature a digital I/O interface that enables co-operation with external devices. Frames are available in three-slot or nine-slot types and suit flexible adaptation to small and medium-sized measurement systems. Importantly, the series SMU provides flexible measurement timing control to support better overall system performance.

Regarding productivity, the series offers the ability to perform simultaneous measurements of voltage and current. Also, by accelerating communication within the frame and between a PC, the new SMU fosters elevated levels of work efficiency, where high-speed data transfer reduces the total measurement time and significantly enhances operational efficiency.

Static testing of laser diode modules: The series SMU can generate different voltages or currents from several channels and use the sweep synchronisation function to measure the I/V or I/L characteristics of optical communication devices like laser diodes. It can also perform wavelength-I measurements on photo diodes in synchronisation with a tunable light source.

Filter characteristic testing of WDM photo-diode modules: The AQ2300 series SMU can generate different voltages or currents from several WDM channels and use the sweep synchronisation function to measure the filter characteristics of each individual channel.