New high-resolution reflectometer released

Yokogawa Test & Measurement Corporation has released its AQ7420 high-resolution reflectometer. Using OLCR (optical low-coherence reflectometry) technology, the device is ideal for the internal structure analysis of optical modules and the visualisation of microcracks in optical connectors. It supplies a spatial resolution of 40µm and excellent back reflection measurement sensitivity down to -100dB or lower, with no spurious noise. Combined with the optional sensor head unit, users can measure insertion loss simultaneously alongside back reflection, making the device a highly efficient and cost-effective reflectometer for optical market applications.

The company listens constantly to customer feedback and industry trends, developing new innovations in line with market evolution. It became aware of several emerging demands that could not be satisfied with existing market solutions. These included even more reduction of spurious noise, simultaneous measurement of back reflection and insertion loss, enhanced stability of measured waveforms, and faster measurement time. The objective was to develop a new solution that could meet these needs, resulting in the new high-resolution reflectometer. Two models are available: single-wavelength (1310nm) and two-wavelength (1310nm and 1550nm).

Also released is the control software for Windows 11, an optional dedicated sensor head for loss measurement, various master codes (compatible with multiple connector types) and a distance adjustment code to adjust the measurement starting position.

Among the main new features is the ability of the device to lower spurious noise. With conventional OLCR/OFDR technology-based devices, spurious (ghost) noise is often observable in areas where there is no actual reflection (depending on the characteristics of the equipment), leading to misjudgments. Correct waveform analysis relies heavily on users with specialist knowledge in such situations. In contrast, the new device features technology that significantly reduces spurious noise, with ease of analysis among its prominent attributes.

Another feature is the potential to measure back reflection and insertion loss simultaneously. Conventional OLCR/OFDR instruments are often unable to inspect back reflection amount accurately due to the poor measurement accuracy of the vertical axis (amount of reflection level). The reflectometer counters this issue by allowing measurement with an uncertainty of ±3dB. Also, by taking advantage of the optical sensor head, users can measure insertion loss simultaneously with an uncertainty of ±0.02dB.

Another important feature is faster measurement time. Compared with the previous-generation product (AQ7410), the measurement time of the new AQ7420 high-resolution reflectometer is around 50% quicker, approximately six seconds, compared with 12 seconds beforehand.

Applications include detecting the amount and location of reflections inside optical connectors and optical modules with high accuracy and visualising microcracks inside optical connectors that cannot be seen using loss measurement techniques.