Optical spectrum analyser enhances laser diode measurement function

Anritsu Corporation introduces the measurement function (MS9740B-020) for Optical Spectrum Analyzer MS9740B, that evaluates a pulsed LD chip. The new solution lessens the test time for pulsed LD chips, contributing to the improved production efficiency of high-power LD chips.

LD chip manufacturers and optical equipment vendors evaluate the optical spectrum of LD chips during manufacturing. Higher communication bit rates and longer LiDAR detection ranges drive market demand for high-power LD chips. Also, new use cases, such as External Laser Small Pluggable modules for Co-packaged Optics applications, are expected to accelerate demand. The continuous wave output from a high-power LD chip suffers power drift and wavelength shift as the chip temperature rises. This is prevented by suppressing the temperature rise by employing pulsed LD chips. However, current testing of pulsed LD chips during production takes longer because an external trigger signal is needed to synchronise with the pulsed LD chip.

The new solution speeds up optical spectrum evaluation by removing the necessity for a trigger signal and provides assured measurement reproducibility for even high-power LD chips. This solution assures measurement reproducibility of ±1.4 dB for SMSR. Low SMSR variation enhances the LD chip yield and assists production efficiency.