EVM enables design of affordable high-performance near-infrared spectrometer
19-10-2015 |
Texas Instruments
|
Test & Measurement
The DLP NIRscan, from Texas Instruments (TI) is a complete evaluation module
(EVM) to design a high-performance, affordable near-infrared spectrometer.
The flexible tool contains everything a designer needs to start developing a
DLP-based spectrometer right out of the box. The EVM features the DLP 0.45
WXGA NIR chipset - the first ever DLP chipset optimized for use with
near-infrared (NIR) light. With DLP technology, spectrometers for use in
the food, pharmaceutical, oil/gas and other emerging industries will be able
to deliver lab performance levels in the factory and the field, says the
company.