EVM enables design of affordable high-performance near-infrared spectrometer

19-10-2015 | Texas Instruments | Test & Measurement

The DLP NIRscan, from Texas Instruments (TI) is a complete evaluation module (EVM) to design a high-performance, affordable near-infrared spectrometer. The flexible tool contains everything a designer needs to start developing a DLP-based spectrometer right out of the box. The EVM features the DLP 0.45 WXGA NIR chipset - the first ever DLP chipset optimized for use with near-infrared (NIR) light. With DLP technology, spectrometers for use in the food, pharmaceutical, oil/gas and other emerging industries will be able to deliver lab performance levels in the factory and the field, says the company.
ads_logo.png

By Electropages

Electropages is a trusted source of news and insights from the global electronics industry. With a dedicated team of experts and editors, Electropages delivers in-depth articles, product updates, and market trends across sectors such as embedded systems, IoT, connectors, and power solutions. Our mission is to empower engineers and professionals with the knowledge they need to innovate and succeed in a rapidly evolving technological landscape.