EVM enables design of affordable high-performance near-infrared spectrometer

19-10-2015 | Texas Instruments | Test & Measurement

The DLP NIRscan, from Texas Instruments (TI) is a complete evaluation module (EVM) to design a high-performance, affordable near-infrared spectrometer. The flexible tool contains everything a designer needs to start developing a DLP-based spectrometer right out of the box. The EVM features the DLP 0.45 WXGA NIR chipset - the first ever DLP chipset optimized for use with near-infrared (NIR) light. With DLP technology, spectrometers for use in the food, pharmaceutical, oil/gas and other emerging industries will be able to deliver lab performance levels in the factory and the field, says the company.
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By Electropages Admin