New high-speed photorelays improve semiconductor tester efficiency

Toshiba Electronics Europe GmbH has released two new photorelays that deliver notable improvements for semiconductor testing. The TLP3414S and TLP3431S photorelays provide high-speed turn-on times up to 62% shorter than their predecessors with no loss of performance. They also come in a compact package that is 20% smaller than previously, saving PCB space.

These characteristics make the devices ideal for pin electronics applications in semiconductor testers, which measure DUT with high accuracy and at high speed while switching signals.

The photorelays deliver high-efficiency optical coupling thanks to improvements in IR LED performance and design optimisation of the photodiode arrays. This permits a high-speed turn-on time of up to 150μs. Compared to previous models, the turn-on time of TLP3414S is 50% shorter, and that of TLP3431S is approximately 62% shorter, representing noteworthy performance improvements.

Quicker turn-on times have been accomplished with no detriment to the device's signal attenuation capabilities. ON-state resistance for the TLP3414S is 3-Ohm maximum and 1.2-Ohm maximum for TLP3431S. Output capacitance is typically 6.5pF for both models, which is crucial for lowering high-frequency signal leakage when the output is off. The OFF-state output terminal voltage rating and the ON-state current rating of TLP3414S is 40V/250mA, and that of the TLP3431S is 20V/450mA.

The TLP3414S and TLP3431S use the company's latest S-VSON4T package, which measures just 1.45mm × 2mm × 1.3mm. This decreases the mounting area by approximately 20% compared with its previous packages and contributes to the miniaturisation of equipment.