Highly-integrated low-noise low-drift analogue-to-digital converters

21-09-2015 | Farnell element14 | Semiconductors

Featuring low noise, low drift, 38.4-kSPS and delta-sigma (?S) conversion with an integrated PGA, reference and internal fault monitors, Texas Instruments' (TI) ADS1262 and ADS1263 analogue-to-digital converters are now stocked by Farnell element14. The ADS1263 integrates an auxiliary, 24-bit, ?S ADC intended for background measurements. The sensor-ready ADCs provide complete, high-accuracy, one-chip measurement solutions for the most demanding sensor applications, including weigh scales, strain-gauge sensors, thermocouples and resistance temperature devices (RTD). The devices feature a low-noise, CMOS PGA (gains 1 to 32), a ?S modulator, followed by a programmable digital filter. The flexible analogue front-end (AFE) incorporates two sensor-excitation current sources suitable for direct RTD measurement. A single-cycle settling digital filter maximises multiple-input conversion throughput, while providing 130dB rejection of 50Hz and 60Hz line cycle interference. The ADS1262 and ADS1263 are pin and functional compatible. They are available in a 28-pin TSSOP package and are fully specified over the -40C to +125C temperature range.
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