Highly-integrated low-noise low-drift analogue-to-digital converters
21-09-2015 |
Farnell element14
|
Semiconductors
Featuring low noise, low drift, 38.4-kSPS and delta-sigma (?S) conversion
with an integrated PGA, reference and internal fault monitors, Texas
Instruments' (TI) ADS1262 and ADS1263 analogue-to-digital converters are now
stocked by Farnell element14.
The ADS1263 integrates an auxiliary, 24-bit, ?S ADC intended for background
measurements. The sensor-ready ADCs provide complete, high-accuracy,
one-chip measurement solutions for the most demanding sensor applications,
including weigh scales, strain-gauge sensors, thermocouples and resistance
temperature devices (RTD).
The devices feature a low-noise, CMOS PGA (gains 1 to 32), a ?S modulator,
followed by a programmable digital filter. The flexible analogue front-end
(AFE) incorporates two sensor-excitation current sources suitable for direct
RTD measurement.
A single-cycle settling digital filter maximises multiple-input conversion
throughput, while providing 130dB rejection of 50Hz and 60Hz line cycle
interference.
The ADS1262 and ADS1263 are pin and functional compatible. They are
available in a 28-pin TSSOP package and are fully specified over the -40C to
+125C temperature range.
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