New semi-rigid test probes designed to speed circuit development
22-02-2016 |
Fairview Microwave
|
Test & Measurement
Fairview Microwave has unveiled a new family of semi-rigid test probes
operating up to 6GHz. Designed to assist in testing microwave circuits, the
probes are constructed of high-quality semi-rigid coax and SMA female
connectors.
The test probe assemblies come in multiple cable diameters to help when
attaching the unterminated end of the probe to a circuit board trace. There
are two versions including straight-cut probe ends for those that would like
to customize the dimensions of the centre conductor and dielectric
dimensions, as well as pre-stripped probe ends that are ready for immediate
use. By soldering the outer conductor to the signal ground and the exposed
centre conductor to the trace carrying the signal of interest, simple
sampling measurements can be made without having to create a separate
subassembly circuit board or add a connector to the circuit layout which can
take up valuable real estate.
Fairview provides three diameters of semi-rigid coax and three different
lengths from three inches to 12 inches to fit a variety of trace widths and
applications. All test probe cable assemblies are 100% RF tested to ensure
the cable assemblies operate to 6GHz and also to make sure that the SMA
connector interface meets the 1.35:1 VSWR specification prior to shipping.
To protect the small diameter coax from damage, each part is shipped in a
clear protective tube that can also be used for storing the probes for
future use, says the company.
"Our new semi-rigid test probes provide engineers and designers a
convenient, ready-to-use solution for testing their development circuits or
troubleshooting and analyzing different portions of their circuits," said
Brian McCutcheon, vice president and general manager, Fairview Microwave.