New semi-rigid test probes designed to speed circuit development

22-02-2016 | Fairview Microwave | Test & Measurement

Fairview Microwave has unveiled a new family of semi-rigid test probes operating up to 6GHz. Designed to assist in testing microwave circuits, the probes are constructed of high-quality semi-rigid coax and SMA female connectors. The test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the centre conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed centre conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides three diameters of semi-rigid coax and three different lengths from three inches to 12 inches to fit a variety of trace widths and applications. All test probe cable assemblies are 100% RF tested to ensure the cable assemblies operate to 6GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use, says the company. "Our new semi-rigid test probes provide engineers and designers a convenient, ready-to-use solution for testing their development circuits or troubleshooting and analyzing different portions of their circuits," said Brian McCutcheon, vice president and general manager, Fairview Microwave.
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By Electropages Admin