Evaluation module enables smaller, higher-performance radar, software-defined equipment designs
27-06-2016 |
Mouser Electronics
|
Semiconductors
Mouser Electronics now stocks the ADC32RF45 EVM evaluation module from Texas Instruments. The device demonstrates the performance of a dual 3-GSPS 14-bit ADC32RF45 analog-to-digital converter (ADC) with the JESD204B interface, coming soon to Mouser. It allows design engineers to design smaller, higher-performance radar, software-defined radio, test and measurement, aerospace and defence, wireless communications, and radio astronomy equipment.
The module provides a robust environment for engineers to evaluate the upcoming ADC32RF45 ADC. The ADC32RF45 EVM includes the ADC32RF45 ADC, an onboard LMK04828 clock conditioner, transformer-coupled analog inputs, and easy-to-use software GUI and USB interface. The dual-channel ADC enables direct conversion of RF signals up to 4GHz in the 1st, 2nd and 3rd Nyquist zones, giving designers access to the highest dynamic range and input bandwidth of any 14-bit device. With industry-leading noise spectral density of -155dBFS/Hz and superior noise performance of 58.5dB signal-to-noise ratio at 1.8 GHz input frequency, the module allows detection of even the weakest signals. Designers can also use the multi-band digital down converter capability per ADC channel to extract one or two sub-bands per channel, dramatically reducing the digital interface data throughput up to 92 percent and saving system size, power, and processing resources.
The module is designed to work seamlessly with TI’s TSW14J56 EVM JESD204B data capture and pattern generator card, through the High Speed Data Converter Pro (HSDC Pro) software tool for high-speed data converter evaluation.